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Tof-PEEM（Time-of-flight momentum microscope）*
The time-of-flight momentum microscope is a patented time-of-flight momentum microscope that can image the entire photoelectron emission hemisphere (2πk2) k-space of the illuminated sample area, with a minimum diameter of 1μm in the real space sample area. It is a novel ARPES technology.
- Momentum resolution < 0.01 Å-1
- spatial resolution < 50 nm
- energy resolution < 20 meV
- We can provide a sample stage for L-He cooling
- Can provide parallel spin imaging
| * Authorized agent for Surface Concept's products |