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USM-SPE Electron Spectromicroscope
is a multifunctional high-performance surface analyser, which can be used to study the elemental species, chemical valence and relative content on the surface of solid material samples, as well as to study the properties of solid materials. The real space imaging technique can obtain the surface distribution information of elements and chemical states with high spatial resolution (≤ 50 nm) and high energy resolution (≤ 150 meV). Through the momentum space imaging technique, the electronic energy band structure of materials can be obtained to analyse the material properties. It is widely used in the fields of metals, organic molecules, semiconductors, nanomaterials, biomaterials and catalysis.
Specifications
| Specifications | |
|---|---|
| light source | X-ray/UV laser/pulsed laser |
| Resolution |
Real space: ≤ 30 nm Momentum space: ≤ 0.005 Å-1 Electronic energy: ≤ 50 meV |
| Field of view |
Real space: 1 μm – 200 μm Momentum space: 0.5 – 6.0 Å-1 |
| Sample temperature | 10 K – 2000 K |
| Degree of vacuum | Main Chamber: ≤ 1×10-10 mbar |
Imaging mode and mechanism
| Imaging mode |
|---|
| PEEM |
| ARPES, μARPES |
| NEXAFS |
| (X)MCD, (X)MLD |
| 2PPE |
| Pump-probe |
| Imaging mechanism |
|---|
| Bright field, dark field |
| Band structure |
| Elements and Chemistry |
| Magnetism |
| Work function |
| Application scenarios：Momentum Photoelectron Spectroscopy: ARPES |
| Application scenarios：High Resolution XPS Imaging |
| Application scenarios：High Temporal Resolution Charge and Carrier Dynamics |